Manufacturing

Hitachi High-Tech Presents SU9600 Next-Gen Microscope

Hitachi High-Tech has brought forth the SU9600, a new-generation ultrahigh-resolution scanning electron microscope (SEM) for cutting-edge semiconductor and materials research. The upgraded version provides not only the sub-nanometer-level observation capability but also the enhanced precision, fast data acquisition, and automated imaging workflows that come with it. It builds on Hitachi’s proprietary Cold Field Emission Electron Gun and in-lens objective technologies, delivering higher image stability, brightness, and signal clarity. The SU9600 addresses the growing demand for high-throughput, high-precision analysis as AI-driven semiconductor development accelerates. By integrating automated observation functions and large-scale data handling, it streamlines research and manufacturing processes while reducing operator workload. Also Read: Hitachi Advances in Wind-Resilient Drone Modelling, Opens New Era for Air Mobility in Japan As part of Hitachi’s Lumada 3.0 digital strategy, the SU9600 acts as…

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