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SEMVision H20 \u306f\u30012\u3064\u306e\u91cd\u8981\u306a\u30a4\u30ce\u30d9\u30fc\u30b7\u30e7\u30f3\u3092\u6d3b\u7528\u3057\u3066\u3001\u9ad8\u7cbe\u5ea6\u306e\u6b20\u9665\u5206\u985e\u3068\u3001\u73fe\u5728\u306e\u6280\u8853\u6c34\u6e96\u3088\u308a3\u500d\u4ee5\u4e0a\u901f\u3044\u51e6\u7406\u901f\u5ea6\u3092\u5b9f\u73fe\u3057\u307e\u3059\u3002<\/p>\n

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\u30bd\u30fc\u30b9 PR\u30bf\u30a4\u30e0\u30ba<\/a><\/strong><\/p>","protected":false},"excerpt":{"rendered":"

Applied Materials, Inc. announced a new defect review tool to help leading semiconductor manufacturers continue to push the boundaries of chip miniaturization. The SEMVision\u2122 H20 combines the industry’s most sensitive electron beam technology with advanced AI image recognition to better and faster analyze nanoscale defects buried in the world’s most advanced semiconductor chips. Electron beam imaging has long been a key tool for inspecting extremely small defects that cannot be identified by optical techniques. Its ultra-high resolution allows the analysis of tiny defects hidden within billions of nanoscale circuit patterns. Traditionally, wafers are first optically scanned to identify potential defects, and then an electron beam is used to more precisely […]<\/p>\n","protected":false},"author":4,"featured_media":6570,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_bbp_topic_count":0,"_bbp_reply_count":0,"_bbp_total_topic_count":0,"_bbp_total_reply_count":0,"_bbp_voice_count":0,"_bbp_anonymous_reply_count":0,"_bbp_topic_count_hidden":0,"_bbp_reply_count_hidden":0,"_bbp_forum_subforum_count":0,"wprm-recipe-roundup-name":"","wprm-recipe-roundup-description":"","postBodyCss":"","postBodyMargin":[],"postBodyPadding":[],"postBodyBackground":{"backgroundType":"classic","gradient":""},"footnotes":""},"categories":[208,84,211,237,206,192],"tags":[1364,1367,1368,1366,1365],"ppma_author":[205],"class_list":{"0":"post-6549","1":"post","2":"type-post","3":"status-publish","4":"format-standard","5":"has-post-thumbnail","7":"category-apac","8":"category-industrial-tech","9":"category-japan","10":"category-news","11":"category-regional","12":"category-semiconductorandelectronics","13":"tag-ai-image","14":"tag-applied-materials","15":"tag-cfe-technology","16":"tag-semiconductor-chips","17":"tag-semvision-h20"},"yoast_head":"\nApplied 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